| 张光富,张学军,蒋练军.末端形状对磁纳米薄膜自旋波模式特性的影响[J].材料导报,2016,30(10):148-151, 155 |
| 末端形状对磁纳米薄膜自旋波模式特性的影响 |
| Influence of End Shape on Spin-wave Eigenmodes Properties of Magnetic Nanometer Thin Film |
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| DOI：10.11896/j.issn.1005-023X.2016.10.033 |
| 中文关键词: 自旋波 磁纳米薄膜 微磁学模拟 |
| 英文关键词: spin wave, magnetic nanometer thin film, micromagnetic simulation |
| 基金项目:国家自然科学基金(60571043;11374373);湖南省自然科学基金(14JJ6043);益阳市科技计划项目(2014JZ54) |
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| 摘要点击次数: 2436 |
| 全文下载次数: 2005 |
| 中文摘要: |
| 基于微磁学模拟方法研究了磁纳米膜末端形状对自旋波模式特性的影响。获得了多种不同的局域化、量子化自旋波模式特性,以及末端形状对自旋波模式特性的调制规律。通过裁剪纳米膜的末端形状可有效调控边缘模式自旋波特性,存在一临界裁剪参数h0。当裁剪度h0时,随着h的增大,边缘模式频率快速增加,局域于磁薄膜两末端的磁振荡区域向中央扩展。当h≥ h0时,局域于磁薄膜两末端磁振荡在磁体中央合并为一致振荡模式自旋波,边缘模式被抑制。薄膜末端边缘形状对别的自旋波模式特性影响较小。最后,基于近似色散关系理论模型对研究结果进行了解释。 |
| 英文摘要: |
| The spin-wave eigenmodes properties of nanoelements with the tapered ends have been studied by micromagnetic simulations. Several spin-wave modes and their evolutions with the sharpness of the element ends were characterized. The edge mode localized in the two ends of the element can be effectively tuned by the end shape of element. There is a critical tapered parameter h0. For nanoelements with h0, the frequency of the edge mode increases rapidly with the tapered parameter h and its localized area gradually expands toward the element center, finally, it merges into the fundamental mode at a critical tapered parameter h0. When h≥h0, the edge mode is completely suppressed. The standing spin-wave modes mainly in the internal area of the element are less affected by the element shape. The shifts of their frequencies are small and display different tendencies. The evolution of the spin-wave modes with the element shape was explained based on an approximated spin wave dispersion relation for a uniformly magne-tized rectangular element. |
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